List of AbbreviationsΒΆ


Device under Test. A DUT is a product or system undergoing a test. The test is performed by the devices connected to the DUT. In the context of this manual the USB-SD-Mux is a considered part of the test-system and the USB-SD-Mux is intended to be inserted into the DUT.


Electromagnetic Interference. EMI describes interference in systems caused by electromagnetic radiation generated by other devices or the system itself. EMI can lead to restrictions in functionality or malfunctions.


Electrostatic Discharge. This event describes the sudden flow of electric charge between a charged body and an electric device. The energy released during this event can damage the electric device.